TY - JOUR AU - BalaiĊĦis, P. AU - Eidukas, D. AU - Navikas, D. AU - Vilutis, G. PY - 2000/09/19 Y2 - 2024/03/29 TI - Analysis of Digital Electronic Device Reliability JF - Elektronika ir Elektrotechnika JA - ELEKTRON ELEKTROTECH VL - 28 IS - 5 SE - DO - UR - https://eejournal.ktu.lt/index.php/elt/article/view/18279 SP - AB - There is shown difference between digital electronic device no-failure traditional calculation and exploitation results. There are signed out two areas of dynamic actions influence: ability of digital electronic device functioning and information distortion. The conception of dynamic reliability and main trend of research are formulated. Three dynamic reliability tasks groups are singled out. ER -