The Influence of Non-Uniformity of the Multi-Conductor Line Parameters on Frequency Responses of the Meander Delay Line

Authors

  • A. Krukonis Vilnius Gediminas Technical University
  • S. Mikucionis Vilnius Gediminas Technical University
  • V. Urbanavicius Vilnius Gediminas Technical University

DOI:

https://doi.org/10.5755/j01.eee.19.6.4279

Keywords:

effective permittivity, impedance matching, meander delay lines, method of multiconductor line, mode matching

Abstract

Inhomogeneities of the electromagnetic field are observed at the edges of the electrodynamic delay systems which are designed based on the concept of periodic multiconductor line. The inhomogeneity manifests itself as a non-uniformity of the characteristic impedance and the effective permittivity of the multiconductor line consisting of a finite number of conductors. The influence of non-uniformity of impedance and effective permittivity of the multiconductor microstrip line on the frequency responses and characteristics of meander delay lines is studied in this paper. It is shown that matching characteristic impedance and effective permittivity of the multiconductor line the bandwidth of the delay line can be extended and delay time increased preserving its dimensions.

DOI: http://dx.doi.org/10.5755/j01.eee.19.6.4279

Author Biographies

A. Krukonis, Vilnius Gediminas Technical University

Department of Electronics Engineering, Vilnius Gediminas Technical University, Phd student

S. Mikucionis, Vilnius Gediminas Technical University

Department of Electronics Engineering, Vilnius Gediminas Technical University, Phd student

V. Urbanavicius, Vilnius Gediminas Technical University

Department of Electronics Engineering, Vilnius Gediminas Technical University, dr. prof.

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Published

2013-05-02

How to Cite

Krukonis, A., Mikucionis, S., & Urbanavicius, V. (2013). The Influence of Non-Uniformity of the Multi-Conductor Line Parameters on Frequency Responses of the Meander Delay Line. Elektronika Ir Elektrotechnika, 19(6), 81-86. https://doi.org/10.5755/j01.eee.19.6.4279

Issue

Section

HIGH FREQUENCY TECHNOLOGY, MICROWAVES