Research of Action Influence to Digital Electronic Device No-failure

  • P. Balaišis
  • D. Eidukas
  • D. Navikas
  • G. Vilutis

Abstract

States of digital electronic devices (DED) are discussed. Also presented: actions to the reliability of the devices, conditions of dynamic action. DED’s reliability to external electrical dynamic actions test is described. There are separated two test ways: analytic and experimental. Questions of creation of the action streams are discussed.
Published
2000-08-20
How to Cite
Balaišis, P., Eidukas, D., Navikas, D., & Vilutis, G. (2000). Research of Action Influence to Digital Electronic Device No-failure. Elektronika Ir Elektrotechnika, 27(4). Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/16866
Section
Articles