Modelling of Defectivity of Sequential Structure Processes

  • L. Nedostup
  • M. Kiselichnik
  • Y. Bobalo

Abstract

There are discussed the defect formation processes during the full-scale production of radioelectronic devices. Approaches to their modelling taking into account additive and multiplicative components of defectivity are described. There are shown results of experimental investigations of these processes using as examples the full-scale production of electronic oscilloscopes and frequency counters.
Published
1997-02-14
How to Cite
Nedostup, L., Kiselichnik, M., & Bobalo, Y. (1997). Modelling of Defectivity of Sequential Structure Processes. Elektronika Ir Elektrotechnika, 10(1). Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/15736
Section
Articles