The Testing Methods of Programmable Integrated Circuits

  • V. Abraitis Kaunas University of Technology
  • E. Bareiša Kaunas University of Technology
  • R. Benisevičiūtė Kaunas University of Technology

Abstract

In this paper the types of structures of programmable integrated circuits (FPGA), their possibilities, advantages and faults are considered. The fault models of programmable integrated circuits are analyzed, when programmable integrated circuits are configured to implement a given application. Proposed fault model can be used with traditionally automatic test sequence generators. The results of experiment show that for different synthesis of the same circuit we need different test sequences. Ill. 4, bibl. 15 (in Lithuanian; summaries in Lithuanian, English and Russian).

Published
2003-08-20
How to Cite
Abraitis, V., Bareiša, E., & Benisevičiūtė, R. (2003). The Testing Methods of Programmable Integrated Circuits. Elektronika Ir Elektrotechnika, 47(5). Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/11240
Section
T 171 MICROELECTRONICS