Functional Test Generation Procedures

  • E. Bareiša Kaunas University of Technology
  • V. Jusas Kaunas University of Technology
  • K. Motiejūnas Kaunas University of Technology
  • R. Šeinauskas Kaunas University of Technology

Abstract

The aim is to explore the features of one of test generation sub problems, namely the functional test generation sub problem, and on the basis of the gained experience, to propose a practical method for functional test generation. In the paper presented analysis of random search methods and adjacent stimuli generation allowed formulating a practical procedure for generating functional tests. This method exploits the advantages of random and deterministic search, as well the feature that the sets of the selected input stimuli can be merged easily in order to obtain a better set of test patterns. Ill. 1, bibl. 7 (in English; summaries in English, Russian and Lithuanian).

Published
2015-03-20
Section
T 170 ELECTRONICS