Embedded Method of Soc Memory Repairing

  • V. Hahanov Kharkov National University of Radioelectronics
  • W. Gharibi Kharkov National University of Radioelectronics
  • K. Mostovaya Kharkov National University of Radioelectronics

Abstract

It is proposed SoC Functional Intellectual Property Infrastructure that differ by minimal set of the embedded diagnosis processes in real time and enables to realize such services: functional testing on basis of generable input patterns and analysis of output reactions; SoC diagnosis with given resolution of fault location; fault simulation to carry out the first two procedures on basis of the fault detection table. Structural-algebraic method of embedded fault diagnosis of SoC functional blocks is proposed. The method uses preliminary analysis of the fault detection table to reduction its size and subsequent DNF construction computation, which forms all solutions of SoC functional diagnosis in real time. Ill. 3, bibl. 12 (in English; summaries in English, Russian and Lithuanian).

Author Biographies

V. Hahanov, Kharkov National University of Radioelectronics
W. Gharibi, Kharkov National University of Radioelectronics
K. Mostovaya, Kharkov National University of Radioelectronics
Published
2009-02-01
How to Cite
Hahanov, V., Gharibi, W., & Mostovaya, K. (2009). Embedded Method of Soc Memory Repairing. Elektronika Ir Elektrotechnika, 90(2), 55-60. Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/10507
Section
T 170 ELECTRONICS