Functional Delay Test Construction Approaches

Authors

  • E. Bareiša Kaunas University of Technology
  • V. Jusas Kaunas University of Technology
  • K. Motiejūnas Kaunas University of Technology
  • R. Šeinauskas Kaunas University of Technology

Abstract

It is explored how functional delay tests constructed at algorithmic level detect transition faults at gate-level. Main attention was paid to investigation of the possibilities to improve the transition fault coverage using n-detection functional delay fault tests. The proposed functional delay test construction approaches allowed achieving 99 % transition fault coverage which is acceptable even for manufacturing test. Bibl. 18 (in English; summaries in English, Russian and Lithuanian).

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Published

2007-02-01

How to Cite

Bareiša, E., Jusas, V., Motiejūnas, K., & Šeinauskas, R. (2007). Functional Delay Test Construction Approaches. Elektronika Ir Elektrotechnika, 74(2), 49-54. Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/10370

Issue

Section

T 125 AUTOMATION, ROBOTICS