Functional Delay Test Construction Approaches

E. Bareiša, V. Jusas, K. Motiejūnas, R. Šeinauskas

Abstract


It is explored how functional delay tests constructed at algorithmic level detect transition faults at gate-level. Main attention was paid to investigation of the possibilities to improve the transition fault coverage using n-detection functional delay fault tests. The proposed functional delay test construction approaches allowed achieving 99 % transition fault coverage which is acceptable even for manufacturing test. Bibl. 18 (in English; summaries in English, Russian and Lithuanian).


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Print ISSN: 1392-1215
Online ISSN: 2029-5731