Functional Delay Test Construction Approaches

  • E. Bareiša Kaunas University of Technology
  • V. Jusas Kaunas University of Technology
  • K. Motiejūnas Kaunas University of Technology
  • R. Šeinauskas Kaunas University of Technology

Abstract

It is explored how functional delay tests constructed at algorithmic level detect transition faults at gate-level. Main attention was paid to investigation of the possibilities to improve the transition fault coverage using n-detection functional delay fault tests. The proposed functional delay test construction approaches allowed achieving 99 % transition fault coverage which is acceptable even for manufacturing test. Bibl. 18 (in English; summaries in English, Russian and Lithuanian).

Published
2015-03-16
Section
T 125 AUTOMATION, ROBOTICS